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378-810-3 M Plan Apo SL20X Objective for bright-field observation in visible range, SL Super Long working distance Analogue 3 µm (< 0

SKU 97536321917
4.4
USD1096.38 USD1133.38

Pay in 4 interest-free payments of $274.10 Learn more

Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Aug 18 - Aug 23

Description

3 µm (< 0

keyways and other

Manual Test Stand TSB100

Extension rods: 5 (13

TIME 5100 Portable LEEB Hardness Tester - C Probe

378-810-3 M Plan Apo SL20X Objective for bright-field observation in visible range, SL Super Long working distance Analogue 3 µm (< 0Features Super Long Working Distances Infintiy Corrected Bright Field Inspection High Qualtiy Plan Apochromat Design Flat Image Surface over Entire Field of View Features Model: M Plan Apo SL 20X Working distance: In Air: 30. 5 mm Corrected Wave Length: 436 656 nm N. A.: 0. 28 f: 10 mm P. D.: 95 mm R: 1 m FOV 1: 1. 2 mm FOV 2: 0,24 x 0,32 mm Abbreviations in product table: N. A.: Numerical aperture W. D.: Working distance P. D.: Parfocal distance f:

Exchange/Return Notes
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